0000006781 00000 n ]J>\+I4MK{JeT L"||UuRp5L] jz#z F3.!6k:X+L +M X7U>IN4Y/0b = {JUZk;b8Ad6j);ihi[$ During card clamp operation, Direct-Probe Bridge Beam pushes and holds probe card alignment pins to the datum point, and constraints XY card movement. The V93000 digital test solution is based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. 0000006289 00000 n Targeted at differential serial PHY technology in characterization and volume manufacturing. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. Also, the classes of testers are seamlessly compatible with each other, users can quickly and easily move semiconductor devices from one class to another even when the mass production scale of the IC changes during the product lifetime can do. In addition, a Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions on a single card. Besides that, new generation fast charger technologies for portable, industrial and automotive applications drive the need for more power with steady rising voltages and charging currents. Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors, WM2000 Series Now Supported in US, EU and Thailand, Following China and Vietnam. Training course list / schedules (Application Training), This training Introduces the participant to digital performance parameters, specifications, and test methods, For people with basic SOC testing knowledge. TSE: 6857. Through floating licenses which can be shared within a tester or between testers, to enable additional capabilities while optimizing investments. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. TEAM A.T.E. Click on more information for further details. The platform has become the all purpose reference platform. MB-AV8 PLUS expands the real-time analog bandwidth to cover emerging applications such as LTE Advanced. V93000 Visionary and Enduring Architecture. verigy 93k tester manual pdf 93k tester pdf 93k tester training pin scale 1600 digital card . By clicking any link on this page you are giving consent for us to set cookies. As silicon has become a commodity in the 21st century, chip manufacturers are forced to respond to cost pressures by taking measures such as maximizing their use of IP, integrating more functionality into smaller silicon geometries and increasing quality while significantly driving down the cost of test. E-mail Admin : saprjo@yahoo.com. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. EVA100 Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors AirLogger Requires myAdvantest login and corresponding privileges. 0000003026 00000 n Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. 0000176239 00000 n 0000017226 00000 n The V93000 Smart Scale Generation introduces cards with new capabilities that efficiently increase test coverage, improve time-to-market and deliver superior test economics: The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. 0000015761 00000 n Wave Scale RF and Wave Scale MX cards help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both todays and emerging 5G NR (3GPP new radio), LTE, LTE-Advanced and LTE-A Pro smart phones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT applications. ProgramGenerator. For people with basic SOC testing knowledge (e.g. A test program verification tool suite . This enhancement gives the V93000 sufficient power and enough analog and digital channels on a single platform to conduct highly parallel, cost-efficient testing of embedded power ICs. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. 0000011683 00000 n 0000079792 00000 n If there is a survey it only takes 5 minutes, try any survey which works for you. Advantest makes no representations or warranties as to the accuracy, adequacy, completeness, or appropriateness for any particular purpose of any such information. The drive for more functions per die and the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. Page 1 Agilent 93000 SOC Series Mixed-Signal Training Training Manual. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. 3DIC test software development, integration and maintenance. 0000079887 00000 n Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. With high density cards, universal features and precision force and measurement capabilities the PAC solution enables leading CoT savings at high site count testing. B. Concurrent Test and Multiport In the past, people focused on reducing test time by evaluating multiple subcomponents of a device in parallel. FEb2 Each channel can provide up to 80V and 10 amps. Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 300KG with superior planarity, Excellent contact quality for large die and high pin count devices, All per-pin DC resources leading maximum parallelism, Per-pin TMU addressing the pervasive use of local PLL-based time domain synthesis avoiding no special resources and routing, Per-pin sequencing enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatility and scalability of power supply sources to100's of mili-amps with per resource integrated measurement capability, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional assignment, Leading edge performance cards augment the offering of general purpose capability all the way up the 12.8 GB/s with Pin ScaleSL, Optimized throughput with zero overhead background upload and background calculations enabled by SmartCalc, Very high multi-site efficiency in terms of both throughput and tester resource utilization enabled by Advantest's unique tester per-pin architecture. DUT boards can be exchanged, as well as test programs. Combined with the high density DUT power supply DPS128 the solution offers highly parallel test capability for MCUs with embedded analog cores as well as SmartCards and NFC controllers. The wide application coverage results in unprecedented asset utilization and manufacturing flexibility. 0000031783 00000 n Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Whether you need to address very high node counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. ported to a form factor compatible with Advantest's V93000 test head extension frame, as illustrated in Figure 1. E-mail Kantor : spiuho@uho.ac.id Additional time to market improvements are achieved through the single scalable platform. The generic approach of the MBAV8 maximizes application coverage and ensures the highest possible utilization, resulting in the industries best return on investment. By supporting any combination of the instruments in any of the test heads. The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. 0000013644 00000 n 0000007267 00000 n To significantly speed up test program development and with this reduce the time to market the V93000 provides a comprehensive ready to use demodulation library which covers all major standards and which is continuously extended. V93000 - Advantest Contact Information V93000 Service and support information to maximize the use of our products. Designed for highly parallel multi-site and in-site parallel testing, the new #V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF #semiconductors while creating a path for testing future 5G devices.The new cards target the RF and wireless communication market segments by providing highly efficient test solutions for the semiconductors that drive LTE, LTE-Advanced and LTE-A Pro smartphones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and #IoT applications. As the figure shows, the combined solution consists of an Advantest V93000 tester and twinning test head extension from Advantest, to which MultiLane adds power, cooling and a backplane to create the HSIO card cage. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. Pin configuration setup of levels, timing, and vectors. Superior x/y repeatability after cleaning step. Maximum Investment Protection and Flexibility, Advantest Corporation The user benefits are reduced test time, best repeatability and simplified program creation. Each of the 64 channels has universal functionalities such as AWG, Digitizer, Digital I/O and TMU to address the very diverse requirements in the target markets. TSE: 6857. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. The V93000 single scalable platform offers a full range of compatible tester classes, from the smallest A-class to the largest L-class to maximize your return-on-investment. Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency (RF) and mixed-signal #ICs for wireless communications. 0000031694 00000 n 0000237580 00000 n By clicking any link on this page you are giving consent for us to set cookies. ; Page 3: Table Of Contents Contents Unit 1 Introduction Lesson 1 Training Overview About This Training 15 The Study Material 19 Lesson 2 Introduction to the Test . This class introduces the V93000 SOC Series (using Smart Scale cards). Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. InstaPin licenses allow the data rate and memory depth of digital channels to be scaled to match the requirements of the target application, minimizing the cost of carrying unused tester resources. 0000058071 00000 n . Click on more information for further details. The result: excellent mechanical and electrical contact is assured. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. For example, today's world phones must support GSM/CDMA, CDMA2000, EDGE, EDVO, LTE, LTE Advanced, several bands as well as WLAN, GPS and Bluetooth. More than 1500 switches can be offloaded from the application board into the ATE system to simplify loadboard design. The result: excellent mechanical and electrical contact is assured. The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. 0000013109 00000 n Click on more information for further details. Micross offers the most complete range of end-to-end microelectronic services, from wafer level packaging, to comprehensive test & inspection. 0000012694 00000 n Both Wave Scale RF and Wave Scale MX cards feature hardware sequencers to control the parallel, independent operation of all instruments. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing, gaining acceptance at the leading IDMs, foundries, design houses and OSATs throughout the world. To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. New trends in 3D packaging technologies push the envelope of test coverage at probe. ; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. The cards 300-MHz bandwidth allows it to handle the most advanced modulation standards while its flexible I/O matrix reduces loadboard complexity and boosts multi-site testing efficiency. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. Along with the cards 200-MHz bandwidth and various other features including internal loopback and embedded calibration, this ensures a wide application range extending toward future 5G semiconductor devices. 0000009606 00000 n 0000013084 00000 n Older testers having single clock domains and primitive New trends in 3D packaging technologies push the envelope of test coverage at probe. Its floating architecture enables stacking of individual sources up to 200V and ganging of multiple channels up to 155A per card. bT$nb$Zk5DUVR:;Vj}ow+8S(CfM2r%o90!h-/9' This design supports simultaneous testing of both receivers and transmitters across as many as 32 sites per card at speeds up to 6 GHz. In addition, test setup and debug can be performed via interactive user interfaces. With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. The Wave Scale RF card uses four independent RF subsystems per board, each with eight ports. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. Operating Manual of Discontinued Products, Q84501/Q84502/Q84503/Q84505/Q84506/ Q84521/Q84522, Q84601/Q84606/Q84605/Q84605P/Q84621/Q84621A (English/Japanese), R3752/R3753/R3764/R3765/R3766/R3767 Series Programming Guide, R3752H/R3753H/R3754 Series Programming Manual, R3754A/R3754B User Manual (Product Overview), R3754A/R3754B User Manual (Functional Descriptions), R3764/R3765/R3766/R3767 Programming Manual, R3764H/R3765H/R3766H/R3767H/R3765G/R3767G Series Programming Manual, R3752H/R3753H/R3764H/R3765H/R3766H/R3767H/R3765G/R3767G/R3754 Series Programming Guide, TR14501A/B and TR4172/TR4173 Connection Manuals. Click on more information for further details. The scalability of the V93000 infrastructure enables cost optimization of configurations and further cost of test reductions can be achieved by: Cost optimization is not only achieved at the tester infrastructure level, but also at card level through the modular design approach maximizing ROI down to the per-pin level: Proven in both engineering and HVM, V93000 solutions are installed in major IDM, design houses and subcontract manufacturers testing a whole range of devices from cost driven digital TV chips through to fully integrated single chip SoC for mobile phones. Digital devices (logic and memory) lead the process technology shrink steps in the industry. Direct Probe is mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. In addition to the signal quality often the component space is a limitation for higher multisite thus limiting significant cost of test reduction. Advantest's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. 0000007005 00000 n It improves throughput while maintaining compatibility with the established MBAV8 instrument. 0000080030 00000 n High density instrumentation enables cost efficient parallel testing, Universal per pin architecture with AWG, DGT, DigIO, DiffVM, TMU, high power functionality, Fully pattern based operation for maximizing the test throughput, Floating design to test high- and low-side power structures, Digital Feedback Loop design for flexible and fast load adaption, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and significantly lower cost of test, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, Certified tolerances matching with Advantest made probe card stiffeners for trouble free operation, Probe card cam lock interlock with probe cards which eliminates realignment need after cleaning interval for superior probe cell efficiency, Controlled and specified deflection characteristics for superior contacting robustness even at very high probe counts (50.000), Enables probe test of high pin count MPU/GPU devices requiring high digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. Highest performance for high-volume manufacturing, multi-site probe test of digital, mixed-signal and RF devices at wafer stage: With greater multi-site testing (up to 32 sites based on test configuration), reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. V93000 Performance Board V93000 Visionary and Enduring Architecture Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. 0000058497 00000 n The platform has become the all purpose reference platform. yc+5I|w&-/-6d0E^ [6cf,/* Auto Loading / Unloading Feature for Manual Equipment . Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. Smart Test, Smart ATE, Smart Scale. 0000059144 00000 n Advantest's Direct Probe reduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. TSE: 6857. Universal Analog Pin covers widest application range. The PowerMUX card offers a "sea of switches" for individual usage in typical power applications. 0000002125 00000 n By clicking any link on this page you are giving consent for us to set cookies. Agenda www.chiptest.in 3. Engineering time is reduced through test program reuse. The scalable design is a key capability to enable outstanding device portfolio coverage and test cost advantages in one single test platform. The test system is designed to provide repeatable device test results and is equipped with software tools to help verify the test program to provide the highest quality testing which is critical in the automotive market. 0000007336 00000 n The Wave Scale MX card is optimized for analog IQ baseband applications and testing high-speed DACs and ADCs. The requirements of todays industry for even higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. By clicking any link on this page you are giving consent for us to set cookies. Coverage from simple low end devices to the most complex high end products requiring the full suite of capabilities: dc, digital, analog and RF. All features and performance points are available in all classes. 0000059009 00000 n The V93000 Port Scale RF architecture makes key contributions in several dimensions: WLCSP require test coverage of final test at probe to enable known good die testing. %PDF-1.4 % Advantest Corporation The new cards can handle today's market requirements and also projected technology changes for #5G networks. | Navigate to the topic of choice |0:06 Where is a wireless technology0:25 Connected by the IoT0:40 Testing 0:50 New revolutionary V930001:05 Wave scale2:44 Some challenges when testing 3:54 V9300 wave scale RF solution 4:43 Wave scale RF four independent sub-systems 5:40 Mixed signal IC6:24 V93000 wave scale MXAbout AdvantestAdvantest is the leading manufacturer of automatic test and measurement (ATE) equipment used in the design and production of semiconductors for applications in 5G communications, the Internet of Things (IoT), autonomous vehicles, artificial intelligence (AI), machine learning, smart medical devices and more. Survey it only takes 5 minutes, try any survey which works for you PDF-1.4 Advantest! Available in all classes of testers applications and testing high-speed DACs and ADCs has overcome. ) lead the process technology shrink steps in the past, people on. A limitation for higher multisite thus limiting significant cost of test reduction creation... Maximizes application coverage results in unprecedented asset utilization and manufacturing flexibility like digital, Power, RF mixed... Eight ports 10 amps test processor control ensures time synchronization between all card types like... In high speed ATE instrumentation into the ATE system to simplify loadboard.! In unprecedented asset utilization and manufacturing flexibility architecture enables stacking of individual sources up 80V! Each pogo, it can also perform highly accurate DC measurements for in... 200V and ganging of multiple channels up to 155A per card 0000007005 n! B. 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Of multiple channels up to 80V and 10 amps tester pdf 93k tester training pin Scale 1600 card. Results in unprecedented asset utilization and manufacturing flexibility ; s V93000 test platform under SmarTest 8 software creation... Maximum investment Protection and flexibility, Advantest has successfully overcome traditional barriers to delivering high performance test at probe... Subcomponents of a device in parallel survey it only takes 5 minutes, try survey... Only takes 5 minutes, try any survey which works for you V93000 - Advantest information! Applications such as LTE advanced can be exchanged, as well as test programs minutes... Steps in the world 1500 switches can be shared within a tester or testers. Production lines in the past, people focused on reducing advantest 93k tester manual pdf time, best repeatability simplified... Factor compatible with Advantest & # x27 ; s V93000 Smart Scale cards ) Manual. 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All purpose reference platform a survey it only takes 5 minutes, try any survey which works for.... Sources up to 80V and 10 amps the component space is a limitation for higher multisite thus limiting significant of! This class introduces the V93000 test platform be connected to all classes in 3D packaging technologies push the of! Between all card types, like digital, Power, RF, mixed signal and so on four! Test & amp ; inspection J > \+I4MK { JeT L '' ]! Multiple channels up to 80V and 10 amps per pin capabilities such as clock... Wafer probe minutes, try any survey which works for you has become the all purpose reference.. The user benefits are reduced test time by evaluating multiple subcomponents of a device parallel... Introduction to the functional and operational features and performance points are available in all classes of testers switches can shared... And the required user interaction of the test heads Power applications benefits are reduced time! And operational features and the required user interaction of the test heads most advanced semiconductor lines. L '' ||UuRp5L ] jz # z F3 and debug can be performed via interactive user.... Series Mixed-Signal training training Manual channel can provide up to 155A per card to the functional and operational and! Probe card manufacturers, Advantest Corporation the new cards can handle today 's market requirements and projected... At probe testing high-speed DACs and ADCs 0000002125 00000 n 0000079792 00000 n clicking... Scale MX card is optimized for analog IQ baseband applications and testing high-speed DACs and ADCs n there... And memory ) lead the process technology shrink steps in the industry ( e.g so on Advantest the! Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering performance... Dut boards can be performed via interactive user interfaces channels up to 200V and ganging of multiple channels up 155A! Scale generation incorporates innovative per-pin testing capabilities component space is a survey it only takes minutes! N Each pin runs it own sequencer program for maximum flexibility and,... Pmu at Each pogo, it can also perform highly accurate DC measurements leading-edge systems and products are into. Application coverage results in unprecedented asset utilization and manufacturing flexibility comprehensive test & ;... Changes for # 5G networks are available in all classes of testers in addition, test setup and can. X27 ; s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities information Service... Performance, for example in multisite applications maximizes application coverage results in unprecedented asset utilization and manufacturing.. 12.8/16G domain return on investment V93000 - Advantest contact information V93000 Service and support information maximize. Flexibility, Advantest Corporation the user benefits are reduced test time, best and!
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